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Found 6 from your keywords: author="Zappula, Fran"
cover
IEEE Transactions on Reliability | Vol.64 No.1
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IEEE Reliability SocietyKuo, WayZappula, Fran

Table of Content: -Risk and Reliability Are Part of Our Life Computers - Ameliorating Thermally Accelerated Aging With State-Based Application of Fault-- Tolerance in Cyber-Physical Computers - Exploring Data-Level Error Tolerance in High-Performance Solid-State Drives Data Analysis - Inference for a Step-Stress Model With Competing Risks for Failure From the Generalized Exponential Dis…

Edition
Vol. 64 No. 1 (Mar 2015)
ISBN/ISSN
189529
Collation
il., 27 cm.
Series Title
-
Call Number
JOU IEE i
Availability1
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cover
IEEE Journal on Emerging And Selected Topics in Circuits and Systems | Vol.4 …
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Avci, U. EBhunia, S.Delgado-Restituto, ManuelHunter, H. C.Morris, D. HMukhopadhyay, S.Rios, R.Roy, KYen-Kuang ChenYoung, I. A.Zappula, Fran

Edition
Vol. 4 No. 4 (Dec 2014)
ISBN/ISSN
21563357
Collation
il., 27 cm.
Series Title
-
Call Number
JOU EME v.4

Edition
Vol. 4 No. 4 (Dec 2014)
ISBN/ISSN
21563357
Collation
il., 27 cm.
Series Title
-
Call Number
JOU EME v.4
Availability1
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cover
[Jurnal] IEEE Transactions on Professional Communication (Vol. 56/3&4)
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IEEE Professional Communication SocietyZappula, Fran

Edition
Vol. 56 No. 3 & 4 (Dec 2013)
ISBN/ISSN
3611434
Collation
182 hlm.; ilus.; 27 cm.
Series Title
-
Call Number
JOU IEE i

Edition
Vol. 56 No. 3 & 4 (Dec 2013)
ISBN/ISSN
3611434
Collation
182 hlm.; ilus.; 27 cm.
Series Title
-
Call Number
JOU IEE i
Availability0
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cover
IEEE Antennas and Wireless Propagation Letters
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Hao, YangZappula, Fran

Edition
Vol. 13
ISBN/ISSN
1536-1225
Collation
948 hlm.; ilus.; 27 cm.
Series Title
-
Call Number
JOU IEE a v.13

Edition
Vol. 13
ISBN/ISSN
1536-1225
Collation
948 hlm.; ilus.; 27 cm.
Series Title
-
Call Number
JOU IEE a v.13
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cover
IEEE Transactions on Circuits and Systems
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IEEE CIRCUIT AND SYSTEMS SOCIETYPavan, ShantiZappula, Fran

- A Sub-rz W Bandgap Reference Circuit With an Inherent Curvature-Compensation Property - A 12-bit 8.47-flIConversion-Step Capacitor-Swapping SAR ADC in 110-nm CMOS - Distortion Analysis Using Volterra Series and Linearization Technique of Nano-Scale Bu

Edition
Vol. 62 No. 1
ISBN/ISSN
1549-8328
Collation
157 hlm.; ilus.; 27 cm.
Series Title
-
Call Number
JOU IEE c
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cover
Journal of Lightwave Technology
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Winzer, PeterZappula, Fran

Edition
Vol. 32 No. 21 - 24
ISBN/ISSN
0733-8724
Collation
969 hlm.; ilus.; 27 cm.
Series Title
-
Call Number
JOU WIN j

Edition
Vol. 32 No. 21 - 24
ISBN/ISSN
0733-8724
Collation
969 hlm.; ilus.; 27 cm.
Series Title
-
Call Number
JOU WIN j
Availability0
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