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Found 1 from your keywords: author=IEEE Reliability Societ...

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IEEE Transactions on Reliability | Vol.64 No.1

IEEE Reliability Society Kuo, Way Zappula, Fran

Table of Content: -Risk and Reliability Are Part of Our Life Computers - Ameliorating Thermally Accelerated Aging With State-Based Application of Fault-- Tolerance in Cyber-Physical Computers - Exploring Data-Level Error Tolerance in High-Performance Solid-State Drives Data Analysis - Inference for a Step-Stress Model With Competing Risks for Failure From the Generalized Exponential Dis…

Edition: Vol. 64 No. 1 (Mar 2015)
ISBN/ISSN: 189529
Collation: il., 27 cm.
Series Title: -
Call Number: JOU IEE i

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